Il me reconnait pas le -w .
Sinon, le résultat de SMART :
[code]smartctl 5.39 2009-12-09 r2995 [i686-pc-linux-gnu] (local build)
Copyright © 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Fujitsu MHZ2 BH series
Device Model: FUJITSU MHZ2160BH G2
Serial Number: K62TT992SSAP
Firmware Version: 008B000B
User Capacity: 160 041 885 696 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3f
Local Time is: Thu Jan 21 21:49:40 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 649) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 64054
2 Throughput_Performance 0x0005 100 100 030 Pre-fail Offline - 28508160
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 102
5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always - 0 (2000, 0)
7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail Always - 512
8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 115
10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 91
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 5
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 4195
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 35 (Lifetime Min/Max 13/46)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 28
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 (0, 6705)
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 253 000 Old_age Always - 12
200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always - 8994
203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always - 1529060261508
240 Head_Flying_Hours 0x003e 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 12 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 05 34 75 fb e0 Error: ICRC, ABRT 5 sectors at LBA = 0x00fb7534 = 16479540
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 31 75 fb e0 08 00:04:27.345 READ DMA
ef 10 03 e9 75 4a a0 08 00:04:26.402 SET FEATURES [Reserved for Serial ATA]
ca 00 08 e2 75 4a ea 08 00:04:25.322 WRITE DMA
ca 00 38 aa 75 4a ea 08 00:04:25.321 WRITE DMA
ca 00 10 22 dd a1 e8 08 00:04:25.320 WRITE DMA
Error 11 occurred at disk power-on lifetime: 98 hours (4 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 05 7d a7 2d e8 Error: ICRC, ABRT 5 sectors at LBA = 0x082da77d = 137209725
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 7a a7 2d e8 08 00:04:32.117 READ DMA
ef 10 03 b3 e7 d0 a0 08 00:04:26.403 SET FEATURES [Reserved for Serial ATA]
ca 00 08 ac e7 d0 e1 08 00:04:21.872 WRITE DMA
ca 00 68 44 e7 d0 e1 08 00:04:21.871 WRITE DMA
ca 00 08 3c e7 d0 e1 08 00:04:21.871 WRITE DMA
Error 10 occurred at disk power-on lifetime: 90 hours (3 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 fd fc 73 21 e1 Error: ICRC, ABRT 253 sectors at LBA = 0x012173fc = 18969596
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 00 f9 73 21 e1 08 01:14:26.551 READ DMA
ef 10 03 f3 e8 d0 a0 08 01:14:24.499 SET FEATURES [Reserved for Serial ATA]
ca 00 08 ec e8 d0 e1 08 01:14:22.227 WRITE DMA
ca 00 70 7c e8 d0 e1 08 01:14:22.226 WRITE DMA
ca 00 08 74 e8 d0 e1 08 01:14:22.226 WRITE DMA
Error 9 occurred at disk power-on lifetime: 89 hours (3 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 05 1c 2c cf e0 Error: ICRC, ABRT 5 sectors at LBA = 0x00cf2c1c = 13577244
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 19 2c cf e0 08 00:04:27.067 READ DMA
ef 10 03 89 66 4a a0 08 00:04:26.401 SET FEATURES [Reserved for Serial ATA]
ca 00 08 82 66 4a ea 08 00:04:23.820 WRITE DMA
ca 00 48 3a 66 4a ea 08 00:04:23.820 WRITE DMA
ca 00 10 22 8b 08 e8 08 00:04:23.819 WRITE DMA
Error 8 occurred at disk power-on lifetime: 85 hours (3 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 05 64 43 a7 e0 Error: ICRC, ABRT 5 sectors at LBA = 0x00a74364 = 10961764
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
c8 00 08 61 43 a7 e0 08 00:35:45.037 READ DMA
ef 10 03 93 ea d0 a0 08 00:35:39.396 SET FEATURES [Reserved for Serial ATA]
ca 00 08 8c ea d0 e1 08 00:35:37.147 WRITE DMA
ca 00 78 14 ea d0 e1 08 00:35:37.146 WRITE DMA
ca 00 08 a1 3d d3 e0 08 00:35:37.143 WRITE DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[/code]
EDIT : Bon, j’ai utilisé Testdisk sans le -w il me dit que mes partoches sont “OK”!